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Title

Microcolorimeter for measuring the emissivity of thin film high-reflecting samples at cryogenic temperatures

Authors

A.A. Ivanenko, I.A. Tambasov, N.P. Shestakov

Organization

Kirensky Institute of Physics SB RAS, Krasnoyarsk, Russian Federation

Abstract

A solution to the problem of measuring the emissivity (degree of blackness) of thin-film high-reflective samples at cryogenic and room temperatures is proposed. To ensure the required accuracy and sensitivity,a thin-film element containing a platinum temperature sensor and a heater, as well as a high emissivity film (a black body model) has been created. On the basis of these elements, the cryomech TM AC-V12a cryostat of the company Cryomech (USA) and the LTR-EU-8-1 crate of data collection with the ADC and DAC modules of the L-CARD company (Russia) created an installation for measuring heat transfer (carried out by radiation) between film coatings. Measurement processing methods that allow temperature measurement with a standard deviation of 0,001 K are presented. The basic installation elements are described. The measurements carried out at the facility, necessary for calculating the emissivity, are described. A method for calculating the emissivity using the results of measurements carried out using a micro calorimeter is presented.

Keywords

emissivity, blackness degree, «blackbody», resistance thermometer, cryogenic temperatures, highly reflective coatings

References

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For citing this article

Ivanenko A.A., Tambasov I.A., Shestakov N.P. Microcolorimeter for measuring the emissivity of thin film high-reflecting samples at cryogenic temperatures // Spacecrafts & Technologies, 2018, vol. 2, no. 3, pp. 165-169. doi: 10.26732/2618-7957-2018-3-165-169

This Article is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License (CC BY-NC 4.0).