Article

Cover

Title

Algorithm for identifying RLC parameters

Authors

D.K. Lobanov, T.G. Oreshenko, A.E. Schmidt

Organization

Reshetnev Siberian State University of Science and Technology
Krasnoyarsk, Russian Federation

Abstract

The article discusses an algorithm capable of determining the substitution scheme of the investigated circuit and calculating the parameters of its elements without operator intervention, based on the admittance frequency characteristics. This algorithm enhances the functional capabilities of RLC meters and can be applied to solve practical problems related to identifying the substitution scheme of the investigated circuit. As an RLC meter measures the total resistance only at one or several fixed frequencies, obtaining an understanding of the substitution scheme from these measurements is challenging. To select the substitution scheme, an analysis of the impedance or admittance frequency characteristics is required. Typically, this analysis is performed manually and is time- consuming. The proposed algorithm automates the analysis of the admittance frequency characteristics. The algorithm associates values and the sequence of slopes of the admittance frequency characteristics with an array of known sequences and slope values for known substitution schemes. The calculation of substitution scheme parameters is based on the resonance frequencies and the heights of zero slopes. To minimize the impact of noise on result accuracy, a synchronous signal detection method is employed. The article introduces a criterion for assessing the algorithm's performance and conducts testing on several types of circuits. During testing, the relative error in calculating substitution scheme parameters was evaluated, with a maximum value not exceeding 6 %.

Keywords

admittance frequency characteristics, conjugate frequency, electrical parameters, substitution scheme

References

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For citing this article

Lobanov D.K., Oreshenko T.G., Schmidt A.E. Algorithm for identifying RLC parameters // Spacecrafts & Technologies, 2023, vol. 7, no. 4, pp. 279-287. doi: 10.26732/j.st.2023.4.06

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